The Impact of Different Si Surface Terminations in the (001) n-Si/NiOx Heterojunction on the Oxygen Evolution Reaction (OER) by XPS and Electrochemical Methods

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Authors: Sven Tengeler, Mathias Fingerle, Wolfram Calvet, Céline Steinert, Bernhard Kaiser, Thomas Mayer, Wolfram Jaegermann

Journal title: Journal of The Electrochemical Society

Journal number: 165/4

Journal publisher: Electrochemical Society, Inc.

Published year: 2018

Published pages: H3122-H3130

DOI identifier: 10.1149/2.0151804jes

ISSN: 0013-4651