Deep learning-assisted classification of site-resolved quantum gas microscope images

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Authors: Lewis R B Picard, Manfred J Mark, Francesca Ferlaino, Rick van Bijnen

Journal title: Measurement Science and Technology

Journal number: 31/2

Journal publisher: Institute of Physics and the Physical Society

Published year: 2020

Published pages: 025201

DOI identifier: 10.1088/1361-6501/ab44d8

ISSN: 0957-0233