Temperature and process-aware performance monitoring and compensation for an ULP multi-core cluster in 28nm UTBB FD-SOI technology

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Authors: Alfio Di Mauro, Davide Rossi, Antonio Pullini, Philippe Flatresse, Luca Benini

Journal title: 2017 27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-8

DOI identifier: 10.1109/PATMOS.2017.8106979

ISBN: 978-1-5090-6462-5