Main memory organization trade-offs with DRAM and STT-MRAM options based on gem5-NVMain simulation frameworks

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Authors: Manu Komalan, Oh Hyung Rock, Matthias Hartmann, Sushil Sakhare, Christian Tenllado, Jose Ignacio Gomez, Gouri Sankar Kar, Arnaud Furnemont, Francky Catthoor, Sophiane Senni, David Novo, Abdoulaye Gamatie, Lionel Torres

Journal title: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Journal publisher: IEEE

Published year: 2018

Published pages: 103-108

DOI identifier: 10.23919/DATE.2018.8341987

ISBN: 978-3-9819263-0-9