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Authors: F. Hjeij, C. Dalmay, B. Bessette, G. Begaud, A. Bessaudou, Pierre Blondy, M. O. Jauberteau, F. Lalloue, C. Baristiran Kaynak, Mehmet Kaynak, W. Gamal, C. Palego, Arnaud Pothier
Journal title: 2017 IEEE MTT-S International Microwave Symposium (IMS)
Journal publisher: IEEE
Published year: 2017
Published pages: 533-536
DOI identifier: 10.1109/MWSYM.2017.8058618
ISBN: 978-1-5090-6360-4