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Authors: Meissa Babay, Clement Hallepee, Claire Dalmay, Bruno Barelaud, Emre Can Durmaz, Canan Baristiran Kaynak, Mehmet Kaynak, David Cordeau, Arnaud Pothier
Journal title: 2020 IEEE/MTT-S International Microwave Symposium (IMS)
Journal publisher: IEEE
Published year: 2020
Published pages: 456-459
DOI identifier: 10.1109/ims30576.2020.9223884
ISBN: 978-1-7281-6815-9