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Authors: L.H. Li, L. Chen, J.R. Freeman, M. Salih, P. Dean, A.G. Davies, E.H. Linfield
Journal title: Electronics Letters
Journal number: 53/12
Journal publisher: Institute of Electrical Engineers
Published year: 2017
Published pages: 799-800
DOI identifier: 10.1049/el.2017.0662
ISSN: 0013-5194