Bias-Dependent Intrinsic RF Thermal Noise Modeling and Characterization of Single-Layer Graphene FETs

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Authors: Nikolaos Mavredakis, Anibal Pacheco-Sanchez, Paulius Sakalas, Wei Wei, Emiliano Pallecchi, Henri Happy, David Jimenez

Journal title: IEEE Transactions on Microwave Theory and Techniques

Journal number: 69/11

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 4639-4646

DOI identifier: 10.1109/tmtt.2021.3105672

ISSN: 0018-9480