There is Plenty of Room for THz Tunneling Electron Devices Beyond the Transit Time Limit

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Authors: Matteo Villani, Simone Clochiatti, Werner Prost, Nils Weimann, Xavier Oriols

Journal title: IEEE Electron Device Letters

Journal number: 42/2

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 224-227

DOI identifier: 10.1109/led.2021.3049229

ISSN: 0741-3106