Optical microscopy–based thickness estimation in thin GaSe flakes

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Authors: Wenliang Zhang, Qinghua Zhao, Sergio Puebla, Tao Wang, Riccardo Frisenda, Andres Castellanos-Gomez

Journal title: Materials Today Advances

Journal number: 10

Journal publisher: Elsevier

Published year: 2021

Published pages: 100143

DOI identifier: 10.1016/j.mtadv.2021.100143

ISSN: 2590-0498