Quantifying thermal transport in buried semiconductor nanostructures via cross-sectional scanning thermal microscopy

Summary

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Authors: Jean Spièce, Charalambos Evangeli, Alexander J. Robson, Alexandros El Sachat, Linda Haenel, M. Isabel Alonso, Miquel Garriga, Benjamin J. Robinson, Michael Oehme, Jörg Schulze, Francesc Alzina, Clivia Sotomayor Torres, Oleg V. Kolosov

Journal title: Nanoscale

Journal number: 13/24

Journal publisher: Royal Society of Chemistry

Published year: 2021

Published pages: 10829-10836

DOI identifier: 10.1039/d0nr08768h

ISSN: 2040-3364