Spectroscopic thickness and quality metrics for PtSe 2 layers produced by top-down and bottom-up techniques

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Authors: Beata M Szydłowska, Oliver Hartwig, Bartlomiej Tywoniuk, Tomáš Hartman, Tanja Stimpel-Lindner, Zdeněk Sofer, Niall McEvoy, Georg S Duesberg, Claudia Backes

Journal title: 2D Materials

Journal number: 7/4

Journal publisher: IOP Publishing

Published year: 2020

Published pages: 045027

DOI identifier: 10.1088/2053-1583/aba9a0

ISSN: 2053-1583