Contact resistance extraction of graphene FET technologies based on individual device characterization

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Authors: Anibal Pacheco-Sanchez, Pedro C. Feijoo, David Jiménez

Journal title: Solid-State Electronics

Journal number: 172

Journal publisher: Pergamon Press Ltd.

Published year: 2020

Published pages: 107882

DOI identifier: 10.1016/j.sse.2020.107882

ISSN: 0038-1101