1/ f Noise Characterization of Bilayer MoS 2 Field‐Effect Transistors on Paper with Inkjet‐Printed Contacts and hBN Dielectrics

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Authors: Lorenzo Pimpolari, Gabriele Calabrese, Silvia Conti, Robyn Worsley, Subimal Majee, Dmitry K. Polyushkin, Matthias Paur, Cinzia Casiraghi, Thomas Mueller, Giuseppe Iannaccone, Massimo Macucci, Gianluca Fiori

Journal title: Advanced Electronic Materials

Journal number: 7/7

Journal publisher: WILEY

Published year: 2021

Published pages: 2100283

DOI identifier: 10.1002/aelm.202100283

ISSN: 2199-160X