Accuracy of Y-function methods for parameters extraction of two-dimensional FETs across different technologies

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Authors: A. Pacheco-Sanchez, D. Jiménez

Journal title: Electronics Letters

Journal number: 56/18

Journal publisher: Institute of Electrical Engineers

Published year: 2020

Published pages: 942-945

DOI identifier: 10.1049/el.2020.1502

ISSN: 0013-5194