AFM-Based Hamaker Constant Determination with Blind Tip Reconstruction

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Authors: Benny Ku,Ferdinandus van de Wetering,Jens Bolten,Bart Stel,Mark A. van de Kerkhof,Max C. Lemme

Journal title: Advanced Materials Technologies

Journal number: 2365709X

Journal publisher: Wiley

Published year: 2022

DOI identifier: 10.1002/admt.202200411

ISSN: 2365-709X