Imaging of Interlayer Coupling in van der Waals Heterostructures Using a Bright-Field Optical Microscope

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Authors: Evgeny M. Alexeev, Alessandro Catanzaro, Oleksandr V. Skrypka, Pramoda K. Nayak, Seongjoon Ahn, Sangyeon Pak, Juwon Lee, Jung Inn Sohn, Kostya S. Novoselov, Hyeon Suk Shin, Alexander I. Tartakovskii

Journal title: Nano Letters

Journal number: 17/9

Journal publisher: American Chemical Society

Published year: 2017

Published pages: 5342-5349

DOI identifier: 10.1021/acs.nanolett.7b01763

ISSN: 1530-6984