High Current Density Electrical Breakdown of TiS 3 Nanoribbon-Based Field-Effect Transistors

Summary

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Authors: Aday J. Molina-Mendoza, Joshua O. Island, Wendel S. Paz, Jose Manuel Clamagirand, Jose Ramón Ares, Eduardo Flores, Fabrice Leardini, Carlos Sánchez, Nicolás Agraït, Gabino Rubio-Bollinger, Herre S. J. van der Zant, Isabel J. Ferrer, J. J. Palacios, Andres Castellanos-Gomez

Journal title: Advanced Functional Materials

Journal number: 27/13

Journal publisher: John Wiley & Sons Ltd.

Published year: 2017

Published pages: 1605647

DOI identifier: 10.1002/adfm.201605647

ISSN: 1616-301X