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Authors: Francisco Pasadas, Wei Wei, Emiliano Pallecchi, Henri Happy, David Jimenez
Journal title: IEEE Transactions on Electron Devices
Journal number: 64/11
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2017
Published pages: 4715-4723
DOI identifier: 10.1109/TED.2017.2749503
ISSN: 0018-9383