Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network

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Authors: Giovanni Bertoni, Enzo Rotunno, Daan Marsmans, Peter Tiemeijer, Amir H. Tavabi, Rafal E. Dunin-Borkowski, Vincenzo Grillo

Journal title: Ultramicroscopy

Journal publisher: Elsevier BV

Published year: 2023

DOI identifier: 10.1016/j.ultramic.2022.113663

ISSN: 0304-3991