High-energy electron measurements with thin Si detectors

Summary

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Gokul Das H a, R. Dubey a,∗, K. Czerski a, M. Kaczmarski a, A. Kowalska b, N. Targosz–Ślęczka a, M. Valat

Journal title: Measurement

Journal number: 228,114392

Journal publisher: Elsevier BV

Published year: 2024

DOI identifier: 10.1016/j.measurement.2024.114392

ISSN: 0263-2241