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Authors: Enrico Rebufello, Fabrizio Piacentini, Alessio Avella, Muriel Aparecida De Souza, Marco Gramegna, Jan Dziewior, Eliahu Cohen, Lev Vaidman, Ivo Pietro Degiovanni, Marco Genovese
Journal title: Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
Journal publisher: SPIE
Published year: 2020
Published pages: 157
DOI identifier: 10.1117/12.2542097
ISBN: 9781-510633568
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