Topological Data Analysis Made Easy with the Topology ToolKit, What is New?

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Authors: Falk, Martin; Garth, Christoph; Gueunet, Charles; Guillou, Pierre; Gyulassy, Attila; Hofmann, Lutz; Kappe, Christopher; Levine, Joshua,; Lukasczyk, Jonas; Tierny, Julien; Vidal, Jules

Journal title: IEEE VIS Tutorials

Journal number: 1

Journal publisher: IEEE

Published year: 2020