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Authors: K. Chitta, A. Prakash, B. Jaeger, Z. Yu, K. Renz, A. Geiger
Journal title: Pattern Analysis and Machine Intelligence (PAMI)
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2022
DOI identifier: 10.1109/tpami.2022.3200245
ISSN: 0162-8828
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