Micromirror total internal reflection microscopy for high-performance single particle tracking at interfaces

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Authors: Meng, Xuanhui; Sonn-Segev, Adar; Schumacher, Anne; Cole, Daniel; Young, Gavin; Thorpe, Stephen; Style, Robert W.; Dufresne, Eric R.; Kukura, Philipp

Journal title: ACSPhotonics

Journal number: 8 10

Journal publisher: American Chemical Society

Published year: 2021

Published pages: 3111-3118

DOI identifier: 10.1021/acsphotonics.1c01268

ISSN: 2330-4022