Approaches to Measure the Resistivity of Grain Boundaries in Metals with High Sensitivity and Spatial Resolution: A Case Study Employing Cu

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Authors: Hanna Bishara, Matteo Ghidelli, Gerhard Dehm

Journal title: ACS Applied Electronic Materials

Journal number: 2/7

Journal publisher: American Chemical Society

Published year: 2020

Published pages: 2049-2056

DOI identifier: 10.1021/acsaelm.0c00311

ISSN: 2637-6113