Automated crystal orientation mapping by precession electron diffraction assisted four-dimensional scanning transmission electron microscopy (4D-STEM) using a scintillator based CMOS detector

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Jeong, Jiwon; Cautaerts, Niels; Dehm, Gerhard; Liebscher, Christian H.

Journal number: 1

Journal publisher: Arxiv

Published year: 2021