Three-dimensional atomically-resolved analytical imaging with a field ion microscope

Summary

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Authors: Katnagallu, Shyam; Morgado, Felipe Felipe F.; Mouton, Isabelle; Gault, Baptiste; Stephenson, Leigh T.

Journal title: Microscopy and Microanalysis

Journal number: 1

Journal publisher: Cambridge University Press

Published year: 2022

Published pages: 1264-1279

DOI identifier: 10.48550/arxiv.2103.11010

ISSN: 1431-9276