Instance Segmentation of Dislocations in TEM Images

Summary

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Authors: Karina Ruzaeva, Kishan Govind, Marc Legros, Stefan Sandfeld

Journal title: 2023 IEEE 23rd International Conference on Nanotechnology (NANO)

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.1109/nano58406.2023.10231169

ISBN: 979-8-3503-3346-6