Cross-Platform Verification of Intermediate Scale Quantum Devices

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Authors: Andreas Elben, Benoît Vermersch, Rick van Bijnen, Christian Kokail, Tiff Brydges, Christine Maier, Manoj K. Joshi, Rainer Blatt, Christian F. Roos, and Peter Zoller

Journal title: Physical Review Letters

Journal number: 124

Journal publisher: American Physical Society

Published year: 2020

Published pages: 010504

DOI identifier: 10.1103/physrevlett.124.010504

ISSN: 0031-9007