The impacts of data deviations between MRIO models on material footprints: A comparison of EXIOBASE, Eora, and ICIO

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Authors: Stefan Giljum, Hanspeter Wieland, Stephan Lutter, Nina Eisenmenger, Heinz Schandl, Anne Owen

Journal title: Journal of Industrial Ecology

Journal publisher: MIT Press

Published year: 2019

DOI identifier: 10.1111/jiec.12833

ISSN: 1088-1980