Glancing-incidence focussed ion beam milling: A coherent X-ray diffraction study of 3D nano-scale lattice strains and crystal defects

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Authors: Felix Hofmann, Ross J. Harder, Wenjun Liu, Yuzi Liu, Ian K. Robinson, Yevhen Zayachuk

Journal title: Acta Materialia

Journal number: 154

Journal publisher: Elsevier BV

Published year: 2018

Published pages: 113-123

DOI identifier: 10.1016/j.actamat.2018.05.018

ISSN: 1359-6454