X-ray phase imaging with the unified modulated pattern analysis of near-field speckles at a laboratory source

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: M.-C. Zdora, I. Zanette, T. Walker, N. W. Phillips, R. Smith, H. Deyhle, S. Ahmed, P. Thibault

Journal title: Applied Optics

Journal number: 59/8

Journal publisher: OSA Publishing

Published year: 2020

Published pages: 2270

DOI identifier: 10.1364/ao.384531

ISSN: 1559-128X