Summary
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Authors: Jean-Dominique Favreau, Florent Lafarge, Adrien Bousseau, Alex Auvolat
Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2019
Published pages: 1-1
DOI identifier: 10.1109/tpami.2018.2890586
ISSN: 0162-8828
