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Authors: Toufik Sadi, Ivan Radevici, Pyry Kivisaari, Jani Oksanen
Journal title: IEEE Transactions on Electron Devices
Journal number: 66/2
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2019
Published pages: 963-968
DOI identifier: 10.1109/ted.2018.2885267
ISSN: 0018-9383
