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Authors: Eoghan Dunne, Martin O'Halloran, Emily Porter, Julian Bonello, Lourdes Farrugia, Charles V. Sammut, Pierre Schembri-Wismayer
Journal title: IEEE Transactions on Dielectrics and Electrical Insulation
Journal number: 26/1
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2019
Published pages: 229-234
DOI identifier: 10.1109/tdei.2018.007508
ISSN: 1070-9878