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Authors: Kai Han, Sylvestre-Alvise Rebuffi, Sebastien Ehrhardt, Andrea Vedaldi, Andrew Zisserman
Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2021
DOI identifier: 10.1109/tpami.2021.3091944
ISSN: 0162-8828
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