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Authors: Hakan Bilen, Basura Fernando, Efstratios Gavves, Andrea Vedaldi
Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence
Journal number: 40/12
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 2799-2813
DOI identifier: 10.1109/tpami.2017.2769085
ISSN: 0162-8828