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Authors: Sylvestre-Alvise Rebuffi, Andrea Vedaldi, Hakan Bilen
Journal title: 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition
Journal publisher: IEEE
Published year: 2018
Published pages: 8119-8127
DOI identifier: 10.1109/cvpr.2018.00847
ISBN: 978-1-5386-6420-9
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