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Authors: David Novotny, Diane Larlus, Andrea Vedaldi
Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence
Journal number: 42/2
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2020
Published pages: 261-275
DOI identifier: 10.1109/tpami.2018.2871117
ISSN: 0162-8828