Self-Supervised Learning of Geometrically Stable Features Through Probabilistic Introspection

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Authors: David Novotny, Samuel Albanie, Diane Larlus, Andrea Vedaldi

Journal title: 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition

Journal publisher: IEEE

Published year: 2018

Published pages: 3637-3645

DOI identifier: 10.1109/cvpr.2018.00383

ISBN: 978-1-5386-6420-9