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Authors: Paolo Ghelfi, Francesco Laghezza, Filippo Scotti, Giovanni Serafino, Sergio Pinna, Daniel Onori, Antonella Bogoni
Journal title: IEEE International Microwave Symposium
Journal number: 17-22 May 2015
Journal publisher: IEEE
Published year: 2015
DOI identifier: 10.5281/zenodo.223821
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