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Authors: Daniel Deutch, Yuval Moskovitch, Noam Rinetzky
Journal title: 2019 IEEE 35th International Conference on Data Engineering (ICDE)
Journal publisher: IEEE
Published year: 2019
Published pages: 2016-2019
DOI identifier: 10.1109/icde.2019.00228
ISBN: 978-1-5386-7474-1
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