Summary
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Authors: Sebastian Biewer, Pedro R. D'Argenio, Holger Hermanns
Journal title: 2018 IEEE Workshop on Monitoring and Testing of Cyber-Physical Systems (MT-CPS)
Journal publisher: IEEE
Published year: 2018
Published pages: 18-19
DOI identifier: 10.1109/mt-cps.2018.00016
ISBN: 978-1-5386-6748-4
