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Authors: Mads Carlsen; Trygve M Ræder; Can Yildirim; Raquel Rodriguez-Lamas; Carsten Detlefs; Hugh Simons
Journal title: Carlsen , M , Ræder , T M , Yildirim , C , Rodriguez-Lamas , R , Detlefs , C & Simons , H 2022 , ' Fourier ptychographic dark field x-ray microscopy ' , Optics Express , vol. 30 , no. 2 , pp. 2949-2962 . https://doi.org/10.1364/OE.447657
Journal number: 1
Journal publisher: Optical Society of America
Published year: 2022
DOI identifier: 10.1364/oe.447657
ISSN: 1094-4087
