Imaging microstructural dynamics and strain fields in electro-active materials in situ with dark field x-ray microscopy

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Jeppe Ormstrup, Emil V. Østergaard, Carsten Detlefs, Ragnvald H. Mathiesen, Can Yildirim, Mustafacan Kutsal, Philip K. Cook, Yves Watier, Carlos Cosculluela, Hugh Simons

Journal title: Review of Scientific Instruments

Journal number: 91/6

Journal publisher: American Institute of Physics

Published year: 2020

Published pages: 065103

DOI identifier: 10.1063/1.5142319

ISSN: 0034-6748