Probing nanoscale structure and strain by dark-field x-ray microscopy

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Authors: Can Yildirim, Phil Cook, Carsten Detlefs, Hugh Simons, Henning Friis Poulsen

Journal title: MRS Bulletin

Journal number: 45/4

Journal publisher: Materials Research Society

Published year: 2020

Published pages: 277-282

DOI identifier: 10.1557/mrs.2020.89

ISSN: 0883-7694