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Authors: Abdullah Haroon Rasheed; Victor Romero; Florence Bertails-Descoubes; Stefanie Wuhrer; Jean-Sébastien Franco; Arnaud Lazarus
Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence
Journal number: 1
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2021
DOI identifier: 10.1109/tpami.2021.3097547
ISSN: 0162-8828
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