Mapping patent classifications: portfolio and statistical analysis, and the comparison of strengths and weaknesses

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Loet Leydesdorff, Dieter Franz Kogler, Bowen Yan

Journal title: Scientometrics

Journal number: 112/3

Journal publisher: Akademiai Kiado

Published year: 2017

Published pages: 1573-1591

DOI identifier: 10.1007/s11192-017-2449-0

ISSN: 0138-9130