A Deeper Look into DeepCap

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Authors: Marc Habermann, Weipeng Xu, Michael Zollhoefer, Gerard Pons-Moll, Christian Theobalt

Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 1-1

DOI identifier: 10.1109/tpami.2021.3093553

ISSN: 0162-8828